追求卓越•邁向國際
發表單位: CMP-MIC
張貼日期:

97/01/18

IMIC Website: http://www.imic.org

FINAL
CALL FOR PAPERS
THIRTEENTH INTERNATIONAL
CONFERENCE

ON

CHEMICAL-MECHANICAL POLISH (CMP)
PLANARIZATION
FOR ULSI MULTILEVEL INTERCONNECTION (CMP-MIC)  

MARCH 3 - 6, 2008

FREMONT MARRIOTT CALIFORNIA

CMP-MIC CONFERENCE OBJECTIVES

To assemble researchers and technical support personnel from Industry, Universities and Government Laboratories from around the globe to address all current and future issues related to CHEMICAL- MECHANICAL POLISH PLANARIZATION as applied to on-chip ULSI Multilevel Interconnection and other applications.

TOPICAL AREAS

DEVELOPMENTS IN DIELECTRIC & METAL CMP PROCESSES & CONTROL

CMP IN-SITU PROCESSING & MONITORING

ELECTRO-CMP PROCESSING & MONITORING

CMP PROCESS INTEGRATION FOR DIELECTRICS & METALS

CONTAMINATION AND (PRE & POST) CLEANING ISSUES, ENVIRONMENTAL IMPACT

CMP CONSUMABLE DEVELOPMENTS (PADS/SLURRIES/ETC.)

EQUIPMENT AND MANUFACTURING ISSUES & MODELING

METROLOGY, CHARACTERIZATION, TEST; MODELING AND SIMULATION

CMP STANDARDS DEVELOPMENTS, NEW TECHNOLOGIES & PATENT INFO

ALTERNATIVE GLOBAL PLANARIZATION TECHNIQUES AS COMPARED TO CMP

 

詳細內容請見下載檔案

 

檔案下載:08pcall.doc08pcomm.doc

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